Kjøpe SN74ABT18502PM med BYCHPS
Kjøp med garanti
SN74ABT18502PM
- Delenummer:
- SN74ABT18502PM
- Produsent:
- Beskrivelse:
- IC SCAN-TEST-DEV/TXRX 64-LQFP
- Lead Free Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgjengelig mengde:
- 13436 Pieces
- Dataark:
- SN74ABT18502PM.pdf
Introduksjon
BYCHIPS er strømprodusenten for SN74ABT18502PM, vi har aksjene for umiddelbar frakt og også tilgjengelig for lang leveringstid. Vennligst send oss din kjøpsplan for SN74ABT18502PM via e-post, vil vi gi deg en best pris i henhold til planen din.
spesifikasjoner
| Forsyningsspenningen: | 4.5 V ~ 5.5 V |
|---|---|
| Leverandør Enhetspakke: | 64-LQFP (10x10) |
| Serie: | 74ABT |
| emballasje: | Tray |
| Pakke / tilfelle: | 64-LQFP |
| Andre navn: | 296-3939 SN74ABT18502PMG4 SN74ABT18502PMG4-ND |
| Driftstemperatur: | -40°C ~ 85°C |
| Antall bit: | 18 |
| Monteringstype: | Surface Mount |
| Vannfølsomhetsnivå (MSL): | 3 (168 Hours) |
| Produsentens Standard Lead Time: | 6 Weeks |
| Produsentens varenummer: | SN74ABT18502PM |
| Logikk Type: | Scan Test Device with Registered Bus Transceiver |
| Utvidet beskrivelse: | Scan Test Device with Registered Bus Transceiver IC 64-LQFP (10x10) |
| Beskrivelse: | IC SCAN-TEST-DEV/TXRX 64-LQFP |
| Email: | [email protected] |
Beslektede deler til SN74ABT18502PM
| Bilde | Delenummer | produsenter | Beskrivelse | Utsikt |
|---|---|---|---|---|
|
SN74ABT18504PMRG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Forespørsel |
|
SN74ABT18502PMR | Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | Forespørsel |
|
SN74ABT18245ADL | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | Forespørsel |
|
SN74ABT18504PMR | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Forespørsel |
|
SN74ABT18640DLRG4 | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | Forespørsel |
|
SN74ABT18504PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | Forespørsel |
|
SN74ABT18646PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | Forespørsel |
|
SN74ABT18504PMG4 | Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | Forespørsel |
|
SN74ABT18652PM | Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | Forespørsel |
|
SN74ABT18245ADGGR | Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | Forespørsel |
|
SN74ABT18640DLR | Texas Instruments | IC SCAN TEST DEVICE 18BIT 56SSOP | Forespørsel |
Latest News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI to reduce costs in Wireless business; OMAP™ processors and wireless connectivity solutions will focus on embedded markets
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers