Kjøpe SN74ABT8996DWR med BYCHPS
Kjøp med garanti
SN74ABT8996DWR
- Delenummer:
- SN74ABT8996DWR
- Produsent:
- Beskrivelse:
- IC ADDRESSABLE SCAN PORT 24-SOIC
- Lead Free Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgjengelig mengde:
- 16012 Pieces
- Dataark:
- SN74ABT8996DWR.pdf
Introduksjon
BYCHIPS er strømprodusenten for SN74ABT8996DWR, vi har aksjene for umiddelbar frakt og også tilgjengelig for lang leveringstid. Vennligst send oss din kjøpsplan for SN74ABT8996DWR via e-post, vil vi gi deg en best pris i henhold til planen din.
spesifikasjoner
| Forsyningsspenningen: | 4.5 V ~ 5.5 V |
|---|---|
| Leverandør Enhetspakke: | 24-SOIC |
| Serie: | 74ABT |
| emballasje: | Tape & Reel (TR) |
| Pakke / tilfelle: | 24-SOIC (0.295", 7.50mm Width) |
| Andre navn: | 296-4117-2 CABT8996DWRG4 CABT8996DWRG4-ND |
| Driftstemperatur: | -40°C ~ 85°C |
| Antall bit: | 10 |
| Monteringstype: | Surface Mount |
| Vannfølsomhetsnivå (MSL): | 1 (Unlimited) |
| Produsentens varenummer: | SN74ABT8996DWR |
| Logikk Type: | Addressable Scan Ports |
| Utvidet beskrivelse: | Addressable Scan Ports IC 24-SOIC |
| Beskrivelse: | IC ADDRESSABLE SCAN PORT 24-SOIC |
| Email: | [email protected] |
Beslektede deler til SN74ABT8996DWR
| Bilde | Delenummer | produsenter | Beskrivelse | Utsikt |
|---|---|---|---|---|
|
SN74ABT8952DLR | Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | Forespørsel |
|
SN74ABT8996PW | Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | Forespørsel |
|
SN74ABT8996DW | Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | Forespørsel |
|
SN74ABT8996PWR | Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | Forespørsel |
|
SN74ABT8952DLRG4 | Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | Forespørsel |
|
SN74ABT8952DW | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | Forespørsel |
|
SN74ABT841ADWRE4 | Texas Instruments | IC 10BIT BUS-INTFC D 3ST 24-SOIC | Forespørsel |
|
SN74ABT827NSRG4 | Texas Instruments | IC BUFF/DVR TRI-ST 10BIT 24SO | Forespørsel |
|
SN74ABT8952DWR | Texas Instruments | IC SCAN TEST DEVICE 28SOIC | Forespørsel |
|
SN74ABT8952DL | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | Forespørsel |
|
SN74ABT8646DW | Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | Forespørsel |
|
SN74ABT861DW | Texas Instruments | IC TRANSCVR TRI-ST 10BIT 24SOIC | Forespørsel |
|
SN74ABT821ADW | Texas Instruments | IC D-TYPE POS TRG SNGL 24SOIC | Forespørsel |
|
SN74ABT833DW | Texas Instruments | IC TXRX 8-9BIT NON-INV 24SOIC | Forespørsel |
Latest News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI to reduce costs in Wireless business; OMAP™ processors and wireless connectivity solutions will focus on embedded markets
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers