Kjøpe SN74BCT8245ANT med BYCHPS
Kjøp med garanti
SN74BCT8245ANT
- Delenummer:
- SN74BCT8245ANT
- Produsent:
- Beskrivelse:
- IC SCAN TEST DEVICE TXRX 24-DIP
- Lead Free Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgjengelig mengde:
- 12868 Pieces
- Dataark:
- SN74BCT8245ANT.pdf
Introduksjon
BYCHIPS er strømprodusenten for SN74BCT8245ANT, vi har aksjene for umiddelbar frakt og også tilgjengelig for lang leveringstid. Vennligst send oss din kjøpsplan for SN74BCT8245ANT via e-post, vil vi gi deg en best pris i henhold til planen din.
spesifikasjoner
| Forsyningsspenningen: | 4.5 V ~ 5.5 V |
|---|---|
| Leverandør Enhetspakke: | 24-PDIP |
| Serie: | 74BCT |
| emballasje: | Tube |
| Pakke / tilfelle: | 24-DIP (0.300", 7.62mm) |
| Driftstemperatur: | 0°C ~ 70°C |
| Antall bit: | 8 |
| Monteringstype: | Through Hole |
| Vannfølsomhetsnivå (MSL): | 1 (Unlimited) |
| Produsentens varenummer: | SN74BCT8245ANT |
| Logikk Type: | Scan Test Device with Bus Transceivers |
| Utvidet beskrivelse: | Scan Test Device with Bus Transceivers IC 24-PDIP |
| Beskrivelse: | IC SCAN TEST DEVICE TXRX 24-DIP |
| Email: | [email protected] |
Beslektede deler til SN74BCT8245ANT
| Bilde | Delenummer | produsenter | Beskrivelse | Utsikt |
|---|---|---|---|---|
|
SN74BCT8244ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørsel |
|
SN74BCT8240ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Forespørsel |
|
SN74BCT8244ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørsel |
|
SN74BCT8244ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørsel |
|
SN74BCT8245ADWR | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Forespørsel |
|
SN74BCT8244ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørsel |
|
SN74BCT8240ANT | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørsel |
|
SN74BCT8245ANTG4 | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | Forespørsel |
|
SN74BCT8240ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørsel |
|
SN74BCT8240ADW | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørsel |
|
SN74BCT8245ADW | Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | Forespørsel |
|
SN74BCT8244ADWE4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørsel |
|
SN74BCT8240ANTG4 | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | Forespørsel |
|
SN74BCT8240ADWR | Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | Forespørsel |
Latest News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers
- Texas Instruments names Haviv Ilan senior vice president of High Performance Analog