Kjøpe SN74BCT8373ANT med BYCHPS
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SN74BCT8373ANT
- Delenummer:
- SN74BCT8373ANT
- Produsent:
- Beskrivelse:
- IC SCAN TEST DEVICE LATCH 24-DIP
- Lead Free Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgjengelig mengde:
- 13933 Pieces
- Dataark:
- SN74BCT8373ANT.pdf
Introduksjon
BYCHIPS er strømprodusenten for SN74BCT8373ANT, vi har aksjene for umiddelbar frakt og også tilgjengelig for lang leveringstid. Vennligst send oss din kjøpsplan for SN74BCT8373ANT via e-post, vil vi gi deg en best pris i henhold til planen din.
spesifikasjoner
| Forsyningsspenningen: | 4.5 V ~ 5.5 V |
|---|---|
| Leverandør Enhetspakke: | 24-PDIP |
| Serie: | 74BCT |
| emballasje: | Tube |
| Pakke / tilfelle: | 24-DIP (0.300", 7.62mm) |
| Andre navn: | 296-33848-5 SN74BCT8373ANT-ND SN74BCT8373ANTE4 SN74BCT8373ANTE4-ND |
| Driftstemperatur: | 0°C ~ 70°C |
| Antall bit: | 8 |
| Monteringstype: | Through Hole |
| Vannfølsomhetsnivå (MSL): | 1 (Unlimited) |
| Produsentens varenummer: | SN74BCT8373ANT |
| Logikk Type: | Scan Test Device with D-Type Latches |
| Utvidet beskrivelse: | Scan Test Device with D-Type Latches IC 24-PDIP |
| Beskrivelse: | IC SCAN TEST DEVICE LATCH 24-DIP |
| Email: | [email protected] |
Beslektede deler til SN74BCT8373ANT
| Bilde | Delenummer | produsenter | Beskrivelse | Utsikt |
|---|---|---|---|---|
|
SN74BCT8374ADW | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Forespørsel |
|
SN74BCT8373ADWR | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Forespørsel |
|
SN74BCT8373ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Forespørsel |
|
SN74BCT8373ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Forespørsel |
|
SN74BCT8374ADWRE4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Forespørsel |
|
SN74BCT8374ANT | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Forespørsel |
|
SN74BCT8373ADW | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | Forespørsel |
|
SN74BCT8374ADWRG4 | Texas Instruments | IC SCAN TEST DEVICE 24SOIC | Forespørsel |
|
SN74BCT8374ANTG4 | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | Forespørsel |
|
SN74BCT8374ADWR | Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | Forespørsel |
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