Kjøpe SN74LVTH182504APM med BYCHPS
Kjøp med garanti
SN74LVTH182504APM
- Delenummer:
- SN74LVTH182504APM
- Produsent:
- Beskrivelse:
- IC SCAN-TEST-DEV/XCVR 64-LQFP
- Lead Free Status / RoHS Status:
- Blyfri / RoHS-kompatibel
- Tilgjengelig mengde:
- 12959 Pieces
- Dataark:
- SN74LVTH182504APM.pdf
Introduksjon
BYCHIPS er strømprodusenten for SN74LVTH182504APM, vi har aksjene for umiddelbar frakt og også tilgjengelig for lang leveringstid. Vennligst send oss din kjøpsplan for SN74LVTH182504APM via e-post, vil vi gi deg en best pris i henhold til planen din.
spesifikasjoner
| Forsyningsspenningen: | 2.7 V ~ 3.6 V |
|---|---|
| Leverandør Enhetspakke: | 64-LQFP (10x10) |
| Serie: | 74LVTH |
| emballasje: | Tray |
| Pakke / tilfelle: | 64-LQFP |
| Andre navn: | 296-8697 |
| Driftstemperatur: | -40°C ~ 85°C |
| Antall bit: | 20 |
| Monteringstype: | Surface Mount |
| Vannfølsomhetsnivå (MSL): | 3 (168 Hours) |
| Produsentens Standard Lead Time: | 6 Weeks |
| Produsentens varenummer: | SN74LVTH182504APM |
| Logikk Type: | ABT Scan Test Device With Universal Bus Transceivers |
| Utvidet beskrivelse: | ABT Scan Test Device With Universal Bus Transceivers IC 64-LQFP (10x10) |
| Beskrivelse: | IC SCAN-TEST-DEV/XCVR 64-LQFP |
| Email: | [email protected] |
Beslektede deler til SN74LVTH182504APM
| Bilde | Delenummer | produsenter | Beskrivelse | Utsikt |
|---|---|---|---|---|
|
SN74LVTH18502APMR | Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | Forespørsel |
|
SN74LVTH182512DGGR | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | Forespørsel |
|
SN74LVTH182502APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørsel |
|
SN74LVTH182502APMR | Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | Forespørsel |
|
SN74LVTH182652APM | Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | Forespørsel |
|
SN74LVTH18512DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Forespørsel |
|
SN74LVTH18504APMR | Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | Forespørsel |
|
SN74LVTH182646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørsel |
|
SN74LVTH18646APM | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørsel |
|
SN74LVTH18504APMG4 | Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | Forespørsel |
|
SN74LVTH18652APM | Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | Forespørsel |
|
SN74LVTH18514DGGR | Texas Instruments | IC SCAN TEST UNIV TXRX 64TSSOP | Forespørsel |
Latest News
- Xilinx Ships Industry's First 16nm All Programmable MPSoC Ahead of Schedule
- Xilinx and Samsung Jointly Enable the World's First 5G NR Commercial Deployment
- TI's Peter Balyta to head Education Technology division; Melendy Lovett to retire
- Janet Clark to join TI board of directors
- TI unveils DLP® 0.66-inch 4K ultra-high definition (UHD) chip, enabling more affordable large screen projection displays for home, business and education
- GCHQ Director calls for international cyber pact
- Embedded World: Arm introduces fourth security element to PSA
- Last chance: Nominate BrightSparks before 28 February
- Embedded World 2019: Get the full Electronics Weekly Guide
- "Xcell Journal" Special Edition: Xilinx Customers Shape a Brilliant Future
- Xilinx Launches Public Access of the SDSoC Development Environment to Expand Zynq SoC User Base to Broad Community of Systems and Software Engineers
- Texas Instruments names Haviv Ilan senior vice president of High Performance Analog